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Transient Nanostrain Detection in Phi-OTDR Using Statistics-Based Signal Processing
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School of Engineering and Materials Science
School of Engineering and Materials Science
Transient Nanostrain Detection in Phi-OTDR Using Statistics-Based Signal Processing
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School of Engineering and Materials Science
School of Engineering and Materials Science
Transient Nanostrain Detection in Phi-OTDR Using Statistics-Based Signal Processing
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Transient Nanostrain Detection in Phi-OTDR Using Statistics-Based Signal Processing
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Accepted version (1012.Kb)
Volume
38
Pagination
4883 - 4892
DOI
10.1109/JLT.2020.2996232
Journal
JOURNAL OF LIGHTWAVE TECHNOLOGY
Issue
17
ISSN
0733-8724
Metadata
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Authors
Chen, H; Xu, Y; Qian, S; Yuan, H; Su, L
URI
https://qmro.qmul.ac.uk/xmlui/handle/123456789/64879
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School of Engineering and Materials Science
[2990]
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