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dc.contributor.authorChen, Hen_US
dc.contributor.authorXu, Yen_US
dc.contributor.authorQian, Sen_US
dc.contributor.authorYuan, Hen_US
dc.contributor.authorSu, Len_US
dc.date.accessioned2020-06-12T10:09:54Z
dc.date.available2020-05-16en_US
dc.date.issued2020en_US
dc.identifier.issn0733-8724en_US
dc.identifier.urihttps://qmro.qmul.ac.uk/xmlui/handle/123456789/64879
dc.format.extent4883 - 4892en_US
dc.relation.ispartofJOURNAL OF LIGHTWAVE TECHNOLOGYen_US
dc.subjectPerturbation methodsen_US
dc.subjectTransient analysisen_US
dc.subjectSignal detectionen_US
dc.subjectAcousticsen_US
dc.subjectOptical fiber theoryen_US
dc.subjectAcoustic signal detectionen_US
dc.subjectdistributed detectionen_US
dc.subjectrayleigh scatteringen_US
dc.subjectstrain measurementen_US
dc.subjecttime domain reflecto-metryen_US
dc.titleTransient Nanostrain Detection in Phi-OTDR Using Statistics-Based Signal Processingen_US
dc.typeArticle
dc.rights.holder© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.identifier.doi10.1109/JLT.2020.2996232en_US
pubs.author-urlhttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000562293200035&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=612ae0d773dcbdba3046f6df545e9f6aen_US
pubs.issue17en_US
pubs.notesNot knownen_US
pubs.publication-statusPublisheden_US
pubs.volume38en_US
rioxxterms.funderDefault funderen_US
rioxxterms.identifier.projectDefault projecten_US


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