dc.contributor.author | Chen, H | en_US |
dc.contributor.author | Xu, Y | en_US |
dc.contributor.author | Qian, S | en_US |
dc.contributor.author | Yuan, H | en_US |
dc.contributor.author | Su, L | en_US |
dc.date.accessioned | 2020-06-12T10:09:54Z | |
dc.date.available | 2020-05-16 | en_US |
dc.date.issued | 2020 | en_US |
dc.identifier.issn | 0733-8724 | en_US |
dc.identifier.uri | https://qmro.qmul.ac.uk/xmlui/handle/123456789/64879 | |
dc.format.extent | 4883 - 4892 | en_US |
dc.relation.ispartof | JOURNAL OF LIGHTWAVE TECHNOLOGY | en_US |
dc.subject | Perturbation methods | en_US |
dc.subject | Transient analysis | en_US |
dc.subject | Signal detection | en_US |
dc.subject | Acoustics | en_US |
dc.subject | Optical fiber theory | en_US |
dc.subject | Acoustic signal detection | en_US |
dc.subject | distributed detection | en_US |
dc.subject | rayleigh scattering | en_US |
dc.subject | strain measurement | en_US |
dc.subject | time domain reflecto-metry | en_US |
dc.title | Transient Nanostrain Detection in Phi-OTDR Using Statistics-Based Signal Processing | en_US |
dc.type | Article | |
dc.rights.holder | © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |
dc.identifier.doi | 10.1109/JLT.2020.2996232 | en_US |
pubs.author-url | http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000562293200035&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=612ae0d773dcbdba3046f6df545e9f6a | en_US |
pubs.issue | 17 | en_US |
pubs.notes | Not known | en_US |
pubs.publication-status | Published | en_US |
pubs.volume | 38 | en_US |
rioxxterms.funder | Default funder | en_US |
rioxxterms.identifier.project | Default project | en_US |