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dc.contributor.authorSherry, Fen_US
dc.contributor.authorBenning, Men_US
dc.contributor.authorDe los Reyes, JCen_US
dc.contributor.authorGraves, MJen_US
dc.contributor.authorMaierhofer, Gen_US
dc.contributor.authorWilliams, Gen_US
dc.contributor.authorSchonlieb, C-Ben_US
dc.contributor.authorEhrhardt, MJen_US
dc.date.accessioned2020-08-21T14:52:41Z
dc.date.available2020-08-13en_US
dc.date.issued2020en_US
dc.identifier.issn0278-0062en_US
dc.identifier.urihttps://qmro.qmul.ac.uk/xmlui/handle/123456789/66507
dc.format.extent4310 - 4321en_US
dc.relation.ispartofIEEE TRANSACTIONS ON MEDICAL IMAGINGen_US
dc.subjectImage reconstructionen_US
dc.subjectMagnetic resonance imagingen_US
dc.subjectCompressed sensingen_US
dc.subjectReconstruction algorithmsen_US
dc.subjectTrainingen_US
dc.subjectTransformsen_US
dc.subjectOptimizationen_US
dc.subjectMRIen_US
dc.subjectk-space optimisationen_US
dc.subjectcompressed sensingen_US
dc.subjectbilevel learningen_US
dc.subjectregularisationen_US
dc.titleLearning the Sampling Pattern for MRIen_US
dc.typeArticle
dc.rights.holder© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.identifier.doi10.1109/TMI.2020.3017353en_US
pubs.author-urlhttps://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000595547500048&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=612ae0d773dcbdba3046f6df545e9f6aen_US
pubs.issue12en_US
pubs.notesNot knownen_US
pubs.publication-statusPublisheden_US
pubs.volume39en_US
rioxxterms.funderDefault funderen_US
rioxxterms.identifier.projectDefault projecten_US
qmul.funderLearning from mistakes: a supervised feedback-look for imaging applications::Leverhulme Trusten_US


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