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dc.contributor.authorChoi, Sen_US
dc.contributor.authorMin, Den_US
dc.contributor.authorHam, Ben_US
dc.contributor.authorKim, Yen_US
dc.contributor.authorOh, Cen_US
dc.contributor.authorSohn, Ken_US
dc.date.accessioned2019-11-15T10:13:42Z
dc.date.available2015-09-15en_US
dc.date.issued2015-10-27en_US
dc.identifier.issn1057-7149en_US
dc.identifier.urihttps://qmro.qmul.ac.uk/xmlui/handle/123456789/61399
dc.format.extent5953 - 5966en_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.ispartofIEEE Transactions on Image Processingen_US
dc.titleDepth Analogy: Data-Driven Approach for Single Image Depth Estimation Using Gradient Samplesen_US
dc.typeArticle
dc.rights.holder© 2015 IEEE.
dc.identifier.doi10.1109/tip.2015.2495261en_US
pubs.issue12en_US
pubs.notesNot knownen_US
pubs.publication-statusPublisheden_US
pubs.volume24en_US
dcterms.dateAccepted2015-09-15en_US
rioxxterms.funderDefault funderen_US
rioxxterms.identifier.projectDefault projecten_US


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