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dc.contributor.authorPirabul, K
dc.contributor.authorZhao, Q
dc.contributor.authorPan, Z
dc.contributor.authorLiu, H
dc.contributor.authorItoh, M
dc.contributor.authorIzawa, K
dc.contributor.authorKawai, M
dc.contributor.authorCrespo‐Otero, R
dc.contributor.authorDi Tommaso, D
dc.contributor.authorNishihara, H
dc.date.accessioned2024-04-26T09:54:51Z
dc.date.available2024-04-26T09:54:51Z
dc.date.issued2024-04
dc.identifier.issn1613-6810
dc.identifier.urihttps://qmro.qmul.ac.uk/xmlui/handle/123456789/96468
dc.description.abstractIn article number 2306325, Zheng-Ze Pan, Devis Di Tommaso, Hirotomo Nishihara, and co-workers tackle the surface inertness of SiO2 on graphene coating over chemical vapor deposition via the pre-grafting of trimethyl silane (TMS) groups on the pristine SiO2 surface. TMS-grafted SiO2 facilitates the graphene growth via the in-situ formed Si radicals that catalyze CH4 dissociation. This provides insights on the graphene growth chemistries, promoting the synthesis of tailored graphene-based materials.en_US
dc.publisherWileyen_US
dc.relation.ispartofSmall
dc.rightsThis is a pre-copyedited, author-produced version accepted for publication in Small following peer review. The version of record is available at https://onlinelibrary.wiley.com/doi/10.1002/smll.202470125
dc.titleSilicon Radical‐Induced CH4 Dissociation for Uniform Graphene Coating on Silica Surface (Small 16/2024)en_US
dc.typeArticleen_US
dc.rights.holder© 2024 Wiley-VCH GmbH
dc.identifier.doi10.1002/smll.202470125
pubs.issue16en_US
pubs.notesNot knownen_US
pubs.volume20en_US
rioxxterms.funderDefault funderen_US
rioxxterms.identifier.projectDefault projecten_US


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