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dc.contributor.authorKosasih, FUen_US
dc.contributor.authorSu, Fen_US
dc.contributor.authorDu, Ten_US
dc.contributor.authorRatnasingham, SRen_US
dc.contributor.authorBriscoe, Jen_US
dc.contributor.authorDucati, Cen_US
dc.date.accessioned2023-06-09T15:19:06Z
dc.date.available2023-03-03en_US
dc.date.issued2023en_US
dc.identifier.issn1431-9276en_US
dc.identifier.urihttps://qmro.qmul.ac.uk/xmlui/handle/123456789/88839
dc.format.extent1047 - 1061en_US
dc.relation.ispartofMICROSCOPY AND MICROANALYSISen_US
dc.rightsThis is an open access article distributed under the terms of the Creative Commons CC BY license, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
dc.subjectconvolutional neural networken_US
dc.subjectenergy-dispersive X-ray spectroscopyen_US
dc.subjectmaterials' characterizationen_US
dc.subjectprincipal component analysisen_US
dc.subjectscanning transmission electron microscopyen_US
dc.titleDeep Learning-Assisted Multivariate Analysis for Nanoscale Characterization of Heterogeneous Beam-Sensitive Materialsen_US
dc.typeArticle
dc.rights.holder© The Author(s) 2023. Published by Oxford University Press on behalf of the Microscopy Society of America.
dc.rights.holder
dc.identifier.doi10.1093/micmic/ozad033en_US
pubs.author-urlhttps://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000960268300001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=612ae0d773dcbdba3046f6df545e9f6aen_US
pubs.issue3en_US
pubs.notesNot knownen_US
pubs.publication-statusPublisheden_US
pubs.volume29en_US
rioxxterms.funderDefault funderen_US
rioxxterms.identifier.projectDefault projecten_US


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