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HR-EBSD analysis of in situ stable crack growth at the micron scale

dc.contributor.authorKoko, Aen_US
dc.contributor.authorBecker, THen_US
dc.contributor.authorElmukashfi, Een_US
dc.contributor.authorPugno, NMen_US
dc.contributor.authorWilkinson, AJen_US
dc.contributor.authorMarrow, Jen_US
dc.date.accessioned2023-05-26T14:57:33Z
dc.date.available2022-12-06en_US
dc.date.issued2023en_US
dc.identifier.issn0022-5096en_US
dc.identifier.otherARTN 105173
dc.identifier.otherARTN 105173
dc.identifier.otherARTN 105173en_US
dc.identifier.otherARTN 105173en_US
dc.identifier.urihttps://qmro.qmul.ac.uk/xmlui/handle/123456789/88469
dc.relation.ispartofJOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDSen_US
dc.rightsAttribution 3.0 United States*
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/us/*
dc.subjectHR EBSDen_US
dc.subjectJ-integralen_US
dc.subjectStress Intensity Factoren_US
dc.subjectSiliconen_US
dc.subjectCrack Propagationen_US
dc.titleHR-EBSD analysis of in situ stable crack growth at the micron scaleen_US
dc.typeArticle
dc.identifier.doi10.1016/j.jmps.2022.105173en_US
pubs.author-urlhttps://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000906714400001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=612ae0d773dcbdba3046f6df545e9f6aen_US
pubs.notesNot knownen_US
pubs.publication-statusPublisheden_US
pubs.volume172en_US


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Attribution 3.0 United States
Except where otherwise noted, this item's license is described as Attribution 3.0 United States