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On the unsteady forced convection in porous media subject to inlet flow disturbances-A pore-scale analysis

dc.contributor.authorHabib, Ren_US
dc.contributor.authorYadollahi, Ben_US
dc.contributor.authorKarimi, Nen_US
dc.contributor.authorDoranegard, MHen_US
dc.date.accessioned2020-06-17T14:34:24Z
dc.date.issued2020-07en_US
dc.identifier.issn0735-1933en_US
dc.identifier.otherARTN 104639en_US
dc.identifier.urihttps://qmro.qmul.ac.uk/xmlui/handle/123456789/65053
dc.relation.ispartofINTERNATIONAL COMMUNICATIONS IN HEAT AND MASS TRANSFERen_US
dc.rights© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.rightsAttribution 3.0 United States*
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/us/*
dc.subjectUnsteady forced convectionen_US
dc.subjectPorous mediaen_US
dc.subjectFrequency responseen_US
dc.subjectPore-scale analysisen_US
dc.subjectTransfer functionen_US
dc.subjectNonlinear dynamicsen_US
dc.titleOn the unsteady forced convection in porous media subject to inlet flow disturbances-A pore-scale analysisen_US
dc.typeArticle
dc.rights.holder© 2020 The Authors. Published by Elsevier Ltd.
dc.identifier.doi10.1016/j.icheatmasstransfer.2020.104639en_US
pubs.author-urlhttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000551631900016&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=612ae0d773dcbdba3046f6df545e9f6aen_US
pubs.notesNot knownen_US
pubs.publication-statusPublisheden_US
pubs.volume116en_US
rioxxterms.funderDefault funderen_US
rioxxterms.identifier.projectDefault projecten_US


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© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Except where otherwise noted, this item's license is described as © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.