Browsing Physics and Astronomy by Author "Murahari, P"
Now showing items 1-3 of 3
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Decoupling bulk and surface recombination properties in silicon by depth-dependent carrier lifetime measurements
Yokoyama, K; Lord, JS; Miao, J; Murahari, P; Drew, AJ (AIP Publishing, 2021-06-21)Muons, as a bulk probe of materials, have been used to study the depth profile of charge carrier kinetics in Si wafers by scanning the muon implantation depth. The photoexcited muon spin spectroscopy technique can optically ... -
Photoexcited Muon Spin Spectroscopy: A New Method for Measuring Excess Carrier Lifetime in Bulk Silicon
Yokoyama, K; Lord, JS; Miao, J; Murahari, P; Drew, AJ (2017-11-29) -
Reply to: On the observation of photo-excitation effects in molecules using muon spin spectroscopy
Jingliang, M; Wang, K; Murahari, P; Yokoyama, K; Lord, JS; Pratt, FL; He, J; Schulz, L; Willis, M; Anthony, JE (2021-05-10)