Photoexcited Muon Spin Spectroscopy: A New Method for Measuring Excess Carrier Lifetime in Bulk Silicon
Volume
119
DOI
10.1103/PhysRevLett.119.226601
Journal
PHYSICAL REVIEW LETTERS
Issue
ISSN
0031-9007
Metadata
Show full item recordAuthors
Yokoyama, K; Lord, JS; Miao, J; Murahari, P; Drew, AJCollections
- Physics and Astronomy [1329]