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dc.contributor.authorSong, JYen_US
dc.contributor.authorStingelin, Nen_US
dc.contributor.authorGillin, WPen_US
dc.contributor.authorKreouzis, Ten_US
dc.date.accessioned2013-07-03T11:17:43Z
dc.date.issued2008-12-08en_US
dc.identifier.issn0003-6951en_US
dc.identifier.other233306
dc.identifier.other233306
dc.identifier.other233306
dc.identifier.other233306en_US
dc.identifier.other233306en_US
dc.identifier.urihttp://qmro.qmul.ac.uk/xmlui/handle/123456789/4063
dc.descriptionCopyright 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. This article appeared in Applied Physics Letters 93, 233306 (2008) and may be found at <http://apl.aip.org/resource/1/applab/v93/i23/p233306_s1>.
dc.format.extent? - ?en_US
dc.relation.ispartofAPPL PHYS LETTen_US
dc.subjectcurrent densityen_US
dc.subjecthole mobilityen_US
dc.subjectorganic semiconductorsen_US
dc.subjectpolymersen_US
dc.subjectsemiconductor devicesen_US
dc.subjectsemiconductor thin filmsen_US
dc.subjectthin film devicesen_US
dc.titleReduced hole mobility due to the presence of excited states in poly-(3-hexylthiophene)en_US
dc.typeArticle
dc.identifier.doi10.1063/1.3049129en_US
pubs.issue23en_US
pubs.notesNot knownen_US
pubs.volume93en_US


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