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dc.contributor.authorMUHAMMAD, URen_US
dc.contributor.authorYANG, Yen_US
dc.contributor.authorSONG, Yen_US
dc.contributor.authorXIANG, Ten_US
dc.contributor.authorHOSPEDALES, Ten_US
dc.contributor.authorIEEE Conference on Computer Vision and Pattern Recognitionen_US
dc.date.accessioned2018-04-27T10:52:13Z
dc.date.available2018-02-19en_US
dc.date.submitted2018-03-13T11:52:49.342Z
dc.identifier.urihttp://qmro.qmul.ac.uk/xmlui/handle/123456789/36545
dc.rights.uri© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.titleLearning Deep Sketch Abstractionen_US
dc.typeConference Proceeding
pubs.notesNo embargoen_US
pubs.publication-statusAccepteden_US
dcterms.dateAccepted2018-02-19en_US


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