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    Low Stress Ion Conductance Microscopy of Sub-Cellular Stiffness 
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    Low Stress Ion Conductance Microscopy of Sub-Cellular Stiffness

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    Accepted version (840.6Kb)
    Volume
    12
    Pagination
    7953 - 7958
    DOI
    10.1039/c6sm01106c
    Journal
    SOFT MATTER
    Issue
    38
    ISSN
    1744-683X
    Metadata
    Show full item record
    Authors
    Clarke, RW; Novak, P; Zhukov, A; Tyler, EJ; Cano-Jaimez, M; Drews, A; Richards, O; Volynski, K; Bishop, C; Klenerman, D
    URI
    http://qmro.qmul.ac.uk/xmlui/handle/123456789/15344
    Collections
    • Biomedical Engineering and Materials [153]
    Copyright statements
    The Royal Society of Chemistry 2016
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